Minutes, IBIS Quality Committee

12 Aug 2008

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
* Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
* Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
* David Banas, Xilinx
* Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
  Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
* Lance Wang, IOMethodology
  Lynne Green
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
* Moshiul Haque, Micron Technology
  Pavani Jella, TI
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for patent disclosure:

- No one declared a patent.

AR Review:

AR: Mike find out about IBISCHK 1uA leakage and test extrapolation

- Anders create example IBIS file with golden waveforms
  - Not finished, long term

New items:

Mike will be unable to meet next week.
- No meeting next week

Continued review of the IBIS Quality Specification:

5.3.12.	{LEVEL 2}  No leakage current in clamp I-V tables
- Moshiul: Should be "Vcc", not "2 Vcc"
- David: This is fine as long as it does not preclude [Submodel]
  - Mike: Not aware of any available tool to generate [Submodel]
  - Moshiul: Should this be in the IQ spec?
    - Bob: No, it is not always needed
- Bob: No need to change the order

We updated and agreed on 5.3.12

5.3.13.	{LEVEL 2}  Clamp I-V behavior not double-counted
- Moshiul: Sometimes both clamp currents are in GND Clamp
  - Bob: That should not be done
  - Bob: For output only models the clamp currents can not be separated
    - One technique is to "invent" clamp curves based on the Pullup and
      Pulldown, then subtract

5.3.14.	{LEVEL 2}  On-die termination modeling documented
- Ways to model switchable I/O ODT:
  - [Submodel]
  - [Model Selector]
  - [Pullup]/[Pulldown] subtraction
- 5.3.14 should discuss ODT methods
- 5.3.13 applies to ODT and non-ODT
- Bob: s2ibis should have generated full V range curves

AR: Mike rewrite 5.3.13-14

Next meeting:

26 Aug 2008 11-12 AM EST (8-9 AM PST)

Meeting ended at 12:06 PM Eastern Time.